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    S.M.A.R.T test failure

    [F4] ECC Cumulative Threshold Events:                                           0/50, Worst: 100 The above test has a red circle with an X in it when I run HWiNFO64 v5.06-2640.  The disk is a SanDisk X300 SSD.  Drive Model:   SanDisk SD7SB6S256G1122.  Is this an error to be concerned about or...
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